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  • Home
  • Lab
    • Decapsulation
    • Delayering
    • Imaging
    • Process Analysis
  • Engineering
    • Focus Areas >
      • Memory >
        • Samsung 21nm TLC NAND Flash
        • Samsung V-NAND Flash
        • SanDisk 20nm Flash
      • MCU/Processor
      • RF
      • Power Management >
        • AC/DC
        • DC/DC
        • BUCK
        • Boost
        • Driver
        • LDO
        • Regulator
        • Power Management
      • Sensor >
        • Qualcomm Snapdragon Sense ID sensor
      • RFID
      • Frequency Synthesizers
      • ADC/DAC
      • Power Amplifier
      • Other ICs
    • RE Software
    • For Semiconductor Manufacturer
    • For IP firms
  • Reports
    • Device Library
    • Report Format
  • Contact

Process analysis


Our process analysis includes cross-section, EDX inspection, SEM/TEM imaging on longitudinal construction and dimension survey. Analysis can be performed to understand:
  •  number of metal layers
  •  thickness and ingredient of each layer
  •  thickness of each polymer and oxide layer
  •  thickness of gate oxide
  •  structure of transistor
  •  isolation structure of substratum
  •  structure of policide or silicide
  •  material and elements






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