Process analysis
Our process analysis includes cross-section, EDX inspection, SEM/TEM imaging on longitudinal construction and dimension survey. Analysis can be performed to understand:
  •  number of metal layers
  •  thickness and ingredient of each layer
  •  thickness of each polymer and oxide layer
  •  thickness of gate oxide
  •  structure of transistor
  •  isolation structure of substratum
  •  structure of policide or silicide
  •  material and elements